Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...
Testing a circuit breaker is about judging reliability under fault conditions, not just checking continuity or voltage. A ...
A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
The Smart-Thump from HDW Electronics is a fully integrated underground cable fault locating system that requires less training than a traditional thumper because it interprets the results of the ...
New non-volatile memories (NVM) bring new opportunities for changing how we use memory in systems-on-chip (SoCs), but they also add new challenges for making sure they will work as expected. These new ...
HVI can engineer and assemble a complete package for cable testing and/or fault locating, installed on a common platform ready to drop into your van or truck. Aug. 18, 2009 HVI can engineer and ...
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